Abstract: Recognition of wafer map defect patterns is essential for evaluating the reliability of micro-electronic manufacturing. Due to the difficulty of labeling, the available large-scale wafer ...
Accompanying Time's annual person of the year selection Thursday is a magazine cover that resembles the “Lunch Atop a ...
Abstract: Many intravascular procedures are prefaced by the placement of a slender wire called a guidewire. Steering these guidewires is met with challenges in controlling the distal end along with ...
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